Probing microwave fields and enabling in-situ experiments in a transmission electron microscope

F.J.T Goncalves, G.W. Paterson, D McGrouther, Timothy Drysdale, Y Togawa, D.S. Schmool, R.L. Stamps

Research output: Contribution to journalArticlepeer-review

Abstract / Description of output

A technique is presented whereby the performance of a microwave device is evaluated by mapping local field distributions using Lorentz transmission electron microscopy (L-TEM). We demonstrate the method by measuring the polarisation state of the electromagnetic fields produced by a microstrip waveguide as a function of its gigahertz operating frequency. The forward and backward propagating electromagnetic fields produced by the waveguide, in a specimen-free experiment, exert Lorentz forces on the propagating electron beam. Importantly, in addition to the mapping of dynamic fields, this novel method allows detection of effects of microwave fields on specimens, such as observing ferromagnetic materials at resonance.
Original languageEnglish
Article number11064
JournalScientific Reports
Volume7
DOIs
Publication statusPublished - 11 Sept 2017

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