Random telegraph noise in metallic single-walled carbon nanotubes

Hyun-Jong Chung, Tae-Woo Uhm, Sung-Won Kim, Young-Gyu You, Sang Wook Lee, Sung-Ho Jhang, Eleanor E.B. Campbell, Yung Woo Park

Research output: Contribution to journalLetterpeer-review

Abstract / Description of output

We have investigated random telegraph noise (RTN) observed in individual metallic carbon nanotubes (CNTs). Mean lifetimes in high- and low-current states, τhigh and τlow, have been studied as a function of bias-voltage and gate-voltage as well as temperature. By analyzing the statistics and features of the RTN, we suggest that this noise is due to the random transition of defects between two metastable states, activated by inelastic scattering with conduction electrons. Our results indicate an important role of defect motions in the 1/f noise in CNTs.
Original languageEnglish
Article number193102
Number of pages4
JournalApplied Physics Letters
Issue number19
Early online date13 May 2014
Publication statusPublished - 13 May 2014

Keywords / Materials (for Non-textual outputs)

  • carbon nanotubes
  • random telegraph noise
  • activation energies
  • electric measurements
  • electrodes


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