Relative ion yields for SIMS analysis of trace elements in metallic Fe, Fe-Si alloy, and FeSi

M. R. Kilburn, Richard Hinton

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)153-165
Number of pages13
JournalInternational Journal of Mass Spectrometry
Volume207
Issue number3
Publication statusPublished - 2001

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