Original language | English |
---|---|
Pages (from-to) | 153-165 |
Number of pages | 13 |
Journal | International Journal of Mass Spectrometry |
Volume | 207 |
Issue number | 3 |
Publication status | Published - 2001 |
Relative ion yields for SIMS analysis of trace elements in metallic Fe, Fe-Si alloy, and FeSi
M. R. Kilburn, Richard Hinton
Research output: Contribution to journal › Article › peer-review