Sensitivity of a rotating beam sensor for stress evaluation in aluminium thin films

J. M. M. dos Santos, J. C. P. Pina, A. C. Batista, A. B. Horsfall, K. Wang, N. G. Wright, S. M. Soare, S. J. Bull, A. G. ONeill, J. G. Terry, A. J. Walton, A. M. Gundlach, J. T. M. Stevenson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationFourth European Powder Diffraction Conference, Materials Science Forum
Number of pages1
Publication statusPublished - 2005

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