Sidewall damage in $n sup +$ GaAs quantum wires from reactive ion etching

Rebecca Cheung, Y. H. Lee, C. M. Knoedler, K. Y. Lee, P. Smith I. I. I. T, D. P. Kern

Research output: Contribution to journalArticlepeer-review

Original languageUndefined/Unknown
Pages (from-to)2130-2132
Number of pages3
JournalApplied Physics Letters
Volume54
Publication statusPublished - 1989

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