Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

Leora E. Dresselhaus-Marais*, Bernard Kozioziemski, Theodor S. Holstad, Trygve Magnus Ræder, Matthew Seaberg, Daewoong Nam, Sangsoo Kim, Sean Breckling, Sungwook Choi, Matthieu Chollet, Philip K. Cook, Eric Folsom, Eric Galtier, Arnulfo Gonzalez, Tais Gorkhover, Serge Guillet, Kristoffer Haldrup, Marylesa Howard, Kento Katagiri, Sunam KimSunam Kim, Sungwon Kim, Hyunjung Kim, Erik Bergbäck Knudsen, Stephan Kuschel, Hae Ja Lee, Chuanlong Lin, R. Stewart McWilliams, Bob Nagler, Martin Meedom Nielsen, Norimasa Ozaki, Dayeeta Pal, Ricardo Pablo Pedro, Alison M. Saunders, Frank Schoofs, Toshimori Sekine, Hugh Simons, Tim van Driel, Bihan Wang, Wenge Yang, Can Yildirim, Henning Friis Poulsen, Jon H. Eggert

*Corresponding author for this work

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