Single Photon Counting Performance and Noise Analysis of CMOS SPAD-based Image Sensors

Neale Dutton, Istvan Gyongy, Parmesan Luca, Robert Henderson

Research output: Contribution to journalArticlepeer-review

Abstract

SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) of single photon peaks in a photon counting histogram (PCH). The technique is used to identify and analyse cumulative noise in analogue integrating SPC SPAD-based pixels. The DSERN of our SPAD image sensor is exploited to confirm recent multi-photon threshold quanta image sensor (QIS) theory. Finally, various single and multiple photon spatio-temporal oversampling techniques are reviewed.
Original languageEnglish
Pages (from-to)1-17
Number of pages17
JournalSensors
Volume16
Issue number1122
DOIs
Publication statusPublished - 20 Jul 2016

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