Size-dependent reversal of grains in perpendicular magnetic recording media measured by small-angle polarized neutron scattering

Stephen J. Lister, Tom Thomson, Joachim Kohlbrecher, K. Takano, Vikash Venkateramana, Soumya Joyti Ray, Mathew P. Wisemayer, Mark De Vries, H. Do, Y. Ikeda, Stephen L. Lee

Research output: Contribution to journalArticlepeer-review

Abstract

Polarized small-angle neutron scattering has been used to measure the magnetic structure of a CoCrPt-SiO(x) thin-film data storage layer, contained within a writable perpendicular recording media, at granular (< 10 nm) length scales. The magnetic contribution to the scattering is measured as the magnetization is reversed by an external field, providing unique spatial information on the switching process. A simple model of noninteracting nanomagnetic grains provides a good description of the data and an analysis of the grain-size dependent reversal provides strong evidence for an increase in magnetic anisotropy with grain diameter.
Original languageEnglish
Article number112503
Pages (from-to)112503
Number of pages4
JournalApplied Physics Letters
Volume97
Issue number112503
DOIs
Publication statusPublished - 13 Sep 2010

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