Source follower noise limitations in CMOS active pixel sensors

K. M. Findlater*, J. M. Vaillant, D. J. Baxter, C. Augier, D. Herault, R. K. Henderson, J. E.D. Hurwitz, L. A. Grant, J. M. Volle

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

Abstract

CMOS imagers are commonly employing pinned photodiode pixels and true correlated double sampling to eliminate kTC noise and achieve low noise performance. Low noise performance also depends on optimisation of the readout circuitry. This paper investigates the effect of the pixel source follower transistor on the overall noise performance through several characterization methods. The characterization methods are described, and experimental results are detailed. It is shown that the source follower noise can be the limiting factor of the image sensor and requires optimisation.

Original languageEnglish
Pages187-195
Number of pages9
DOIs
Publication statusPublished - 2004
EventDetectors and Associated Signal Processing - St. Etienne, France
Duration: 1 Oct 20032 Oct 2003

Conference

ConferenceDetectors and Associated Signal Processing
CountryFrance
CitySt. Etienne
Period1/10/032/10/03

Keywords

  • Active pixel sensors
  • Correlated double sampling
  • Source follower noise

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