Sources of Error in Extracting the Specific Contact Resistivity From Kelvin Device Measurements

W. J. C. Alexander, A. J. Walton, O. R. Vellacot, O. R. Vellacot

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationIEEE International Conference on Microelectronic Test Structures
Number of pages1
Publication statusPublished - 1988

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