SPICE Sensitivity Analysis of a Bipolar Test Structure During Process development.

N. S. Rankin, A. J. Walton, J. McGinty, M. Fallon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationIEEE International Conference on Microelectronic Test Structures
Pages6
Number of pages1
Publication statusPublished - 2000

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