Statistical SPICE Analysis of a 0.18*mm CMOS Digital/Analog Technology During Process Development

N. S. Rankin, C. Ng, L. S. Ee, F. Boyland, E. Quek, L. Y. Keung, A. J. Walton, M. Redford

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationIEEE International Conference on Microelectronic Test Structures
Number of pages1
Publication statusPublished - 2001

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