Temperature dependence of time averaged hole drift mobility in $As sub 2 S sub 3 $ derived from PA measurements

A. M. Andriesh, I. P. Culeac, P. J. S. Ewen, A. E. Owen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined/Unknown
Title of host publicationCAS '97 Proceedings - 1997 International Semiconductor conference
Number of pages1
Publication statusPublished - 1997

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