Temperature dependence of time averaged hole drift mobility in $As sub 2 S sub 3 $ derived from PA measurements

A. M. Andriesh, I. P. Culeac, P. J. S. Ewen, A. E. Owen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	Undefined/Unknown
Title of host publication	CAS '97 Proceedings - 1997 International Semiconductor conference
Pages	4
Number of pages	1
Publication status	Published - 1997

Cite this

@inproceedings{56b81bc7dbbb464a88431e0922a35630,

title = "Temperature dependence of time averaged hole drift mobility in $As sub 2 S sub 3 $ derived from PA measurements",

author = "Andriesh, {A. M.} and Culeac, {I. P.} and Ewen, {P. J. S.} and Owen, {A. E.}",

year = "1997",

language = "Undefined/Unknown",

pages = "4",

booktitle = "CAS '97 Proceedings - 1997 International Semiconductor conference",

}