Test structure for characterising low voltage coplanar EWOD system

Y. Li; L. Haworth; W. Parkes; A. Walton; M. Yoshio; M. Kubota

doi:10.1109/ICMTS.2008.4509318

Test structure for characterising low voltage coplanar EWOD system

Y. Li, L. Haworth, W. Parkes, A. Walton, M. Yoshio, M. Kubota

School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Other chapter contribution

Abstract

This paper presents test structures designed for studying the relationship between the operation voltage and the configuration of electrode area for coplanar EWOD (ElectroWetting On Dielectrics) devices. Robust anodic Ta O dielectric and thin aFP (amorphous Fluoropolymer) have been used to fabricate the structures. Test structures have been used to characterise the significant contact angle change on asymmetric configurations, 114° to 81° on CYTOP (amorphous fluoropolymer from Asahi Glass Co. Ltd.) with an applied voltage of less than 20V. This demonstrates that by modifying the design, the operating voltage can be reduced by a factor of two, compared to the existing symmetric coplanar EWOD structures. Droplet manipulation on a coplanar EWOD system with this new design has been successfully demonstrated, with a driving voltage of 15V.

Original language	English
Title of host publication	IEEE International Conference on Microelectronic Test Structures
Pages	80-85
Number of pages	6
DOIs	https://doi.org/10.1109/ICMTS.2008.4509318
Publication status	Published - 1 Jan 2008

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10.1109/ICMTS.2008.4509318

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@inbook{d6f1ca2cadb3446a932863005d958d6e,

title = "Test structure for characterising low voltage coplanar EWOD system",

abstract = "This paper presents test structures designed for studying the relationship between the operation voltage and the configuration of electrode area for coplanar EWOD (ElectroWetting On Dielectrics) devices. Robust anodic Ta O dielectric and thin aFP (amorphous Fluoropolymer) have been used to fabricate the structures. Test structures have been used to characterise the significant contact angle change on asymmetric configurations, 114° to 81° on CYTOP (amorphous fluoropolymer from Asahi Glass Co. Ltd.) with an applied voltage of less than 20V. This demonstrates that by modifying the design, the operating voltage can be reduced by a factor of two, compared to the existing symmetric coplanar EWOD structures. Droplet manipulation on a coplanar EWOD system with this new design has been successfully demonstrated, with a driving voltage of 15V.",

author = "Y. Li and L. Haworth and W. Parkes and A. Walton and M. Yoshio and M. Kubota",

year = "2008",

month = jan,

day = "1",

doi = "10.1109/ICMTS.2008.4509318",

language = "English",

pages = "80--85",

booktitle = "IEEE International Conference on Microelectronic Test Structures",

}

TY - CHAP

T1 - Test structure for characterising low voltage coplanar EWOD system

AU - Li, Y.

AU - Haworth, L.

AU - Parkes, W.

AU - Walton, A.

AU - Yoshio, M.

AU - Kubota, M.

PY - 2008/1/1

Y1 - 2008/1/1

N2 - This paper presents test structures designed for studying the relationship between the operation voltage and the configuration of electrode area for coplanar EWOD (ElectroWetting On Dielectrics) devices. Robust anodic Ta O dielectric and thin aFP (amorphous Fluoropolymer) have been used to fabricate the structures. Test structures have been used to characterise the significant contact angle change on asymmetric configurations, 114° to 81° on CYTOP (amorphous fluoropolymer from Asahi Glass Co. Ltd.) with an applied voltage of less than 20V. This demonstrates that by modifying the design, the operating voltage can be reduced by a factor of two, compared to the existing symmetric coplanar EWOD structures. Droplet manipulation on a coplanar EWOD system with this new design has been successfully demonstrated, with a driving voltage of 15V.

AB - This paper presents test structures designed for studying the relationship between the operation voltage and the configuration of electrode area for coplanar EWOD (ElectroWetting On Dielectrics) devices. Robust anodic Ta O dielectric and thin aFP (amorphous Fluoropolymer) have been used to fabricate the structures. Test structures have been used to characterise the significant contact angle change on asymmetric configurations, 114° to 81° on CYTOP (amorphous fluoropolymer from Asahi Glass Co. Ltd.) with an applied voltage of less than 20V. This demonstrates that by modifying the design, the operating voltage can be reduced by a factor of two, compared to the existing symmetric coplanar EWOD structures. Droplet manipulation on a coplanar EWOD system with this new design has been successfully demonstrated, with a driving voltage of 15V.

UR - https://www.scopus.com/pages/publications/51349146664

U2 - 10.1109/ICMTS.2008.4509318

DO - 10.1109/ICMTS.2008.4509318

M3 - Other chapter contribution

AN - SCOPUS:51349146664

SP - 80

EP - 85

BT - IEEE International Conference on Microelectronic Test Structures

ER -

Test structure for characterising low voltage coplanar EWOD system

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Test structure for characterising low voltage coplanar EWOD system

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