Test Structures for Characterising the Integration of EWOD and SAW Technologies for Microfluidics

Y. Li; Y. Q. Fu; Brian Flynn; W. Parkes; Y. Liu; S. Brodie; Jonathan Terry; Leslie Haworth; Andrew Bunting; Tom Stevenson; Stewart Smith; Anthony Walton

doi:10.1109/ICMTS.2010.5466861

Test Structures for Characterising the Integration of EWOD and SAW Technologies for Microfluidics

Y. Li, Y. Q. Fu, Brian Flynn, W. Parkes, Y. Liu, S. Brodie, Jonathan Terry, Leslie Haworth, Andrew Bunting, Tom Stevenson, Stewart Smith, Anthony Walton

School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents details of the design and fabrication of test structures specifically designed for the characterisation of two distinct digital microfluidic technologies: Electro-Wetting On Dielectric (EWOD) and Surface Acoustic Wave (SAW). A test chip has been fabricated that includes structures with a wide range of dimensions and provides the capability to characterise enhanced droplet manipulation as well as other integrated functions. In particular, we detail the use of EWOD to anchor droplets while SAW excitation is applied to perform mixing.

Original language	English
Title of host publication	Proceedings of the IEEE International Conference on Microelectronic Test Structures (ICMTS10)
Publisher	Institute of Electrical and Electronics Engineers
Pages	52-57
Number of pages	6
ISBN (Print)	978-1-4244-6915-4
DOIs	https://doi.org/10.1109/ICMTS.2010.5466861
Publication status	Published - 25 Mar 2010

Access to Document

10.1109/ICMTS.2010.5466861

SMART microsystems
Walton, A. (Principal Investigator)
EPSRC
1/04/10 → 28/02/15
Project: Research
RCUK Fellowship
Smith, S. (Principal Investigator), Anderton, S. (Co-investigator), Bagnaninchi, P. (Co-investigator), Blythe, R. (Co-investigator), Calvert, J. (Co-investigator), Downes, A. (Co-investigator), Frame, M. (Co-investigator), Hay, D. (Co-investigator), Popovic, N. (Co-investigator) & Rambaut, A. (Co-investigator)
EPSRC, STFC
1/10/06 → 30/06/13
Project: Research
RASOR-Radical Solutions for Researching the Proteome: Interdisciplinary Research Collaboration in proteomic technologies
Langridge-Smith, P. (Principal Investigator), Dryden, D. (Co-investigator), Hupp, T. (Co-investigator), Sadler, P. (Co-investigator) & Walton, A. (Co-investigator)
BBSRC
1/08/05 → 31/10/11
Project: Research

Cite this

Li, Y., Fu, Y. Q., Flynn, B., Parkes, W., Liu, Y., Brodie, S., Terry, J., Haworth, L., Bunting, A., Stevenson, T., Smith, S., & Walton, A. (2010). Test Structures for Characterising the Integration of EWOD and SAW Technologies for Microfluidics. In Proceedings of the IEEE International Conference on Microelectronic Test Structures (ICMTS10) (pp. 52-57). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICMTS.2010.5466861

@inproceedings{cfcd2191e4fc42b1848f7afe7b95a3a3,

title = "Test Structures for Characterising the Integration of EWOD and SAW Technologies for Microfluidics",

abstract = "This paper presents details of the design and fabrication of test structures specifically designed for the characterisation of two distinct digital microfluidic technologies: Electro-Wetting On Dielectric (EWOD) and Surface Acoustic Wave (SAW). A test chip has been fabricated that includes structures with a wide range of dimensions and provides the capability to characterise enhanced droplet manipulation as well as other integrated functions. In particular, we detail the use of EWOD to anchor droplets while SAW excitation is applied to perform mixing.",

author = "Y. Li and Fu, {Y. Q.} and Brian Flynn and W. Parkes and Y. Liu and S. Brodie and Jonathan Terry and Leslie Haworth and Andrew Bunting and Tom Stevenson and Stewart Smith and Anthony Walton",

year = "2010",

month = mar,

day = "25",

doi = "10.1109/ICMTS.2010.5466861",

language = "English",

isbn = "978-1-4244-6915-4",

pages = "52--57",

booktitle = "Proceedings of the IEEE International Conference on Microelectronic Test Structures (ICMTS10)",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

}

Li, Y, Fu, YQ, Flynn, B, Parkes, W, Liu, Y, Brodie, S, Terry, J, Haworth, L, Bunting, A, Stevenson, T, Smith, S & Walton, A 2010, Test Structures for Characterising the Integration of EWOD and SAW Technologies for Microfluidics. in Proceedings of the IEEE International Conference on Microelectronic Test Structures (ICMTS10). Institute of Electrical and Electronics Engineers, pp. 52-57. https://doi.org/10.1109/ICMTS.2010.5466861

Test Structures for Characterising the Integration of EWOD and SAW Technologies for Microfluidics. / Li, Y.; Fu, Y. Q.; Flynn, Brian et al.
Proceedings of the IEEE International Conference on Microelectronic Test Structures (ICMTS10). Institute of Electrical and Electronics Engineers, 2010. p. 52-57.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Test Structures for Characterising the Integration of EWOD and SAW Technologies for Microfluidics

AU - Li, Y.

AU - Fu, Y. Q.

AU - Flynn, Brian

AU - Parkes, W.

AU - Liu, Y.

AU - Brodie, S.

AU - Terry, Jonathan

AU - Haworth, Leslie

AU - Bunting, Andrew

AU - Stevenson, Tom

AU - Smith, Stewart

AU - Walton, Anthony

PY - 2010/3/25

Y1 - 2010/3/25

N2 - This paper presents details of the design and fabrication of test structures specifically designed for the characterisation of two distinct digital microfluidic technologies: Electro-Wetting On Dielectric (EWOD) and Surface Acoustic Wave (SAW). A test chip has been fabricated that includes structures with a wide range of dimensions and provides the capability to characterise enhanced droplet manipulation as well as other integrated functions. In particular, we detail the use of EWOD to anchor droplets while SAW excitation is applied to perform mixing.

AB - This paper presents details of the design and fabrication of test structures specifically designed for the characterisation of two distinct digital microfluidic technologies: Electro-Wetting On Dielectric (EWOD) and Surface Acoustic Wave (SAW). A test chip has been fabricated that includes structures with a wide range of dimensions and provides the capability to characterise enhanced droplet manipulation as well as other integrated functions. In particular, we detail the use of EWOD to anchor droplets while SAW excitation is applied to perform mixing.

U2 - 10.1109/ICMTS.2010.5466861

DO - 10.1109/ICMTS.2010.5466861

M3 - Conference contribution

SN - 978-1-4244-6915-4

SP - 52

EP - 57

BT - Proceedings of the IEEE International Conference on Microelectronic Test Structures (ICMTS10)

PB - Institute of Electrical and Electronics Engineers

ER -

Test Structures for Characterising the Integration of EWOD and SAW Technologies for Microfluidics

Abstract

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Projects

SMART microsystems

RCUK Fellowship

RASOR-Radical Solutions for Researching the Proteome: Interdisciplinary Research Collaboration in proteomic technologies

Cite this