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Abstract
Robust and repeatable processes are required to fabricate reference electrodes for micro-scale integrated elec- trochemical sensors. One method for this is to produce a “silver/silver chloride” (Ag/AgCl) electrode through chemical chlorination of a thin film silver layer. This paper presents test structures, which can electrically characterise the process to aid process development and in-line control of the chlorination process.
Original language | English |
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Title of host publication | 2019 IEEE 32nd International Conference on Microelectronics Test Structures |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 58-63 |
Number of pages | 6 |
ISBN (Print) | 9780107281-1464-4 |
DOIs | |
Publication status | Published - 6 Jun 2019 |
Event | 32nd IEEE International Conference on Microelectronic Test Structures - Kitakyushu International Conference Center, Fukuoka, Japan Duration: 18 Mar 2019 → 21 Mar 2019 Conference number: 32 |
Conference
Conference | 32nd IEEE International Conference on Microelectronic Test Structures |
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Abbreviated title | ICMTS 2019 |
Country/Territory | Japan |
City | Fukuoka |
Period | 18/03/19 → 21/03/19 |
Fingerprint
Dive into the research topics of 'Test Structures for Characterising the Silver Chlorination Process During Integrated Ag/AgCl Reference Electrode Fabrication'. Together they form a unique fingerprint.Projects
- 1 Finished
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Implantable Microsystems for Personalised Anti-Cancer Therapy
Murray, A., Smith, S. & Walton, A.
27/05/13 → 31/05/19
Project: Research