The measurement of transistor characteristics using on-chip switching for the connection of instrumentation

D. Ward*, A. J. Walton, J. M. Robertson

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract / Description of output

This paper investigates the feasibility of using on-chip switching for the instrumentation used to measure transistor characteristics. The effect of the switching transistors on the measurements are evaluated by comparing the SPICE parameters extracted from measurements made via the switching transistors with those derived directly. It is shown lthat accurate SPICE parameters can be extracted from process control chips with on-chip switching.

Original languageEnglish
Title of host publicationESSDERC 1987 - 17th European Solid State Device Research Conference
PublisherIEEE Computer Society
Pages919-922
Number of pages4
ISBN (Electronic)0444704779
ISBN (Print)9780444704771
Publication statusPublished - 1 Jan 1987
Event17th European Solid State Device Research Conference, ESSDERC 1987 - Bologna, Italy
Duration: 14 Sept 198717 Sept 1987

Publication series

NameEuropean Solid-State Device Research Conference
ISSN (Print)1930-8876

Conference

Conference17th European Solid State Device Research Conference, ESSDERC 1987
Country/TerritoryItaly
CityBologna
Period14/09/8717/09/87

Fingerprint

Dive into the research topics of 'The measurement of transistor characteristics using on-chip switching for the connection of instrumentation'. Together they form a unique fingerprint.

Cite this