The use of test structures to perform chip level characterisation studies of Ni and NiFe electrochemical deposition

Jeremy Murray*, Richard Perry, Jonathan G. Terry, Stewart Smith, Andrew Mount, Anthony J. Walton

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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    SMART microsystems

    Walton, A.

    EPSRC

    1/04/10 → 28/02/15

    Project: Research