Time-Domain Modeling of Low-Frequency Noise in Deep-Submicrometer MOSFET

N. H. Hamid, Alan Murray, S. Roy

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)233-245
Number of pages13
JournalIEEE Transactions on Circuits and Systems II: Express Briefs
Volume55/1
Publication statusPublished - 1 Feb 2008

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