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Abstract
Security and dependability (S&D) patterns support the structuring and reusing of design solutions to specific known problems. They capture S&D features and support reusing strategies across 'similar' design problems. Despite the fact that they simplify the analysis and implementation of specific design problems concerning with S&D features, the empirical results about S&D patterns and their usages are still patchy. Moreover, there is yet little experience in reporting how S&D patterns transfer across different industry domains. This paper is concerned with the adoption of S&D patterns. It reports our experience in adopting and eliciting S&D patterns in the air traffic management (ATM) domain. Empirical results show how patters provide useful guidance in order to structure the analysis of operational aspects. This paper highlights how S&D patterns, used at the design stage, provide structuring guidance at the operational stage. Hence, they are also useful as structured reaction mechanisms to threats or hazards. In conclusions, this paper provides useful insights about adopting and deploying S&D patterns into and across industry domains.
Original language | English |
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Title of host publication | Database and Expert Systems Application, 2008. DEXA '08. 19th International Workshop on |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 315-319 |
Number of pages | 5 |
DOIs | |
Publication status | Published - 1 Sept 2008 |
Keywords / Materials (for Non-textual outputs)
- air traffic control
- security
- S&D patterns
- air traffic management
- dependability patterns
- security patterns
- structured reaction mechanisms
- Ambient intelligence
- Computerized monitoring
- Data engineering
- Data security
- Databases
- Expert systems
- Hazards
- Laboratories
- Pattern analysis
- Research and development
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Dive into the research topics of 'Using Security and Dependability Patterns for Reaction Processes'. Together they form a unique fingerprint.Projects
- 1 Finished
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Interdisciplinary Design and Evaluation of Dependability (INDEED)
Anderson, S., MacKenzie, D. & Williams, R.
1/12/06 → 28/02/11
Project: Research