XCT analysis of the influence of melt strategies on defect population in Ti-6Al-4V components manufactured by Selective Electron Beam Melting

S. Tammas-Williams*, H. Zhao, F. Léonard, F. Derguti, I. Todd, P. B. Prangnell

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Engineering & Materials Science

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