XCT analysis of the influence of melt strategies on defect population in Ti-6Al-4V components manufactured by Selective Electron Beam Melting

S. Tammas-Williams*, H. Zhao, F. Léonard, F. Derguti, I. Todd, P. B. Prangnell

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'XCT analysis of the influence of melt strategies on defect population in Ti-6Al-4V components manufactured by Selective Electron Beam Melting'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds