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XPS study on dry etching of $ Si/Ge sub x Si sub 1-x $

  • E. van der Drift
  • , T. Zijlstra
  • , E. Fakkeldij
  • , Rebecca Cheung
  • , K. Werner
  • , S. Radelaar

Research output: Contribution to journal › Article › peer-review

Original languageUndefined/Unknown
Pages (from-to)481-485
Number of pages5
JournalMicroelectronic Engineering
Volume27
Publication statusPublished - 1995

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