| Original language | Undefined/Unknown |
|---|---|
| Title of host publication | IEEE Workshop on Defect and Fault Tolerance In VLSI Systems |
| Pages | 9 |
| Number of pages | 1 |
| Publication status | Published - 1990 |
Yield Improvement with Local Design Rules
G. A. Allan, A. J. Walton, R. J. Holwill
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution