Edinburgh Research Explorer
  1. 2020
  2. Comparison of Conventional and Maskless Lithographic Techniques for More than Moore Post-processing of Foundry CMOS Chips

    Tsiamis, A., Li, Y., Dunare, C., Marland, J., Blair, E., Smith, S., Terry, J., Mitra, S., Underwood, I., Murray, A. & Walton, A., 21 Aug 2020, In : Journal of Microelectromechanical Systems. 29, 5, p. 1245-1252 8 p.

    Research output: Contribution to journalArticle

  3. Real-time measurement of tumour hypoxia using an implantable microfabricated oxygen sensor

    Marland, J., Gray, M., Dunare, C., Blair, E., Tsiamis, A., Sullivan, P., González-Fernández, E., Greenhalgh, S., Gregson, R., Clutton, E., Parys, M., Dyson, A., Singer, M., Kunkler, I., Potter, M. A., Mitra, S., Terry, J., Smith, S., Mount, A., Underwood, I. & 3 others, Walton, A., Argyle, D. & Murray, A., 11 Aug 2020, In : Sensing and Bio-Sensing Research.

    Research output: Contribution to journalArticle

  4. Automated Generation, Fabrication and Measurement of Parametric Test Structures for Rapid Prototyping Using Optical Maskless Lithography

    Sullivan, P., Tsiamis, A., Smith, S., Walton, A. & Terry, J., 4 Jun 2020, 33rd IEEE International Conference on Microelectronic Test Structures (ICMTS 2020). Institute of Electrical and Electronics Engineers (IEEE)

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  5. Automated Wafer-Level Characterisation of Electrochemical Test Structures for Wafer Scanning

    Schmueser, I., Mackay, L., Moore, F., Doherty, K., Elliott, J., Mount, A., Walton, A., Smith, S. & Terry, J., 4 Jun 2020, 33rd IEEE International Conference on Microelectronic Test Structures (ICMTS 2020). Institute of Electrical and Electronics Engineers (IEEE)

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  6. Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures

    Schmueser, I., Blair, E., Isiksacan, Z., Li, Y., Corrigan, D., Stokes, A., Terry, J., Mount, A. R. & Walton, A., 4 Jun 2020, IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS 2020). Institute of Electrical and Electronics Engineers (IEEE)

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  7. Optimization of Nafion Polymer Electrolyte Membrane Design and Microfabrication

    Marland, J. R. K., Moore, F., Dunare, C., Tsiamis, A., González-Fernández, E., Blair, E. O., Smith, S., Terry, J. G., Murray, A. F. & Walton, A. J., 8 May 2020, In : IEEE Transactions on Semiconductor Manufacturing. 33, 2, p. 196-201

    Research output: Contribution to journalArticle

  8. Test Structures for Developing Packaging for Implantable Sensors

    Blair, E., Buchoux, A., Tsiamis, A., Dunare, C., Marland, J., Gray, M., Terry, J., Smith, S. & Walton, A., 17 Apr 2020, In : IEEE Transactions on Semiconductor Manufacturing.

    Research output: Contribution to journalArticle

  9. 2019
  10. Effect of vapor pressure on the performance of a Leidenfrost engine

    Agrawal, P., Wells, G. G., Ledesma-Aguilar, R., McHale, G., Buchoux, A., Sefiane, K., Stokes, A., Walton, A. & Terry, J., 23 Nov 2019.

    Research output: Contribution to conferenceAbstract

  11. Wetting phenomena observed in evaporating droplets on structured surfaces

    Tekidou, R., Duursma, G., Mackenzie Dover, C., Kubyshkina, V., Terry, J. & Sefiane, K., 14 Aug 2019, In : Heat Transfer Engineering.

    Research output: Contribution to journalArticle

  12. Test Structures for Characterising the Silver Chlorination Process During Integrated Ag/AgCl Reference Electrode Fabrication

    Dunare, C., Marland, J., Blair, E., Tsiamis, A., Moore, F., Terry, J., Walton, A. & Smith, S., 6 Jun 2019, 2019 IEEE 32nd International Conference on Microelectronics Test Structures. Institute of Electrical and Electronics Engineers (IEEE), p. 58-63 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

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