Characteristics of He II Proximity Profiles

Wei Zheng; David Syphers; Avery Meiksin; Gerard A. Kriss; Donald P. Schneider; Donald G. York; Scott F. Anderson

doi:10.1088/0004-637X/806/1/142

Characteristics of He II Proximity Profiles

Research output: Contribution to journal › Article › peer-review

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Characteristics of He II Proximity Profiles. / Zheng, Wei; Syphers, David; Meiksin, Avery; Kriss, Gerard A.; Schneider, Donald P.; York, Donald G.; Anderson, Scott F.

In: Astrophysical Journal, Vol. 806, No. 1, 142, 10.06.2015, p. 142.

Research output: Contribution to journal › Article › peer-review

Harvard

Zheng, W, Syphers, D, Meiksin, A, Kriss, GA, Schneider, DP, York, DG & Anderson, SF 2015, 'Characteristics of He II Proximity Profiles', Astrophysical Journal, vol. 806, no. 1, 142, pp. 142. https://doi.org/10.1088/0004-637X/806/1/142

APA

Zheng, W., Syphers, D., Meiksin, A., Kriss, G. A., Schneider, D. P., York, D. G., & Anderson, S. F. (2015). Characteristics of He II Proximity Profiles. Astrophysical Journal, 806(1), 142. [142]. https://doi.org/10.1088/0004-637X/806/1/142

Vancouver

Zheng W, Syphers D, Meiksin A, Kriss GA, Schneider DP, York DG et al. Characteristics of He II Proximity Profiles. Astrophysical Journal. 2015 Jun 10;806(1):142. 142. https://doi.org/10.1088/0004-637X/806/1/142

Author

Zheng, Wei ; Syphers, David ; Meiksin, Avery ; Kriss, Gerard A. ; Schneider, Donald P. ; York, Donald G. ; Anderson, Scott F. / Characteristics of He II Proximity Profiles. In: Astrophysical Journal. 2015 ; Vol. 806, No. 1. pp. 142.