Edinburgh Research Explorer

λdB: Blame tracking at higher fidelity

Research output: Contribution to conferencePaper

Standard

λdB: Blame tracking at higher fidelity. / Zalewski, Jakub; Mckinna, James; Morris, J. Garrett; Wadler, Philip.

2020. Paper presented at First ACM SIGPLAN Workshop on Gradual Typing, New Orleans, United States.

Research output: Contribution to conferencePaper

Harvard

Zalewski, J, Mckinna, J, Morris, JG & Wadler, P 2020, 'λdB: Blame tracking at higher fidelity', Paper presented at First ACM SIGPLAN Workshop on Gradual Typing, New Orleans, United States, 25/01/20 - 25/01/20. <https://popl20.sigplan.org/home/wgt-2020>

APA

Zalewski, J., Mckinna, J., Morris, J. G., & Wadler, P. (2020). λdB: Blame tracking at higher fidelity. Paper presented at First ACM SIGPLAN Workshop on Gradual Typing, New Orleans, United States. https://popl20.sigplan.org/home/wgt-2020

Vancouver

Zalewski J, Mckinna J, Morris JG, Wadler P. λdB: Blame tracking at higher fidelity. 2020. Paper presented at First ACM SIGPLAN Workshop on Gradual Typing, New Orleans, United States.

Author

Zalewski, Jakub ; Mckinna, James ; Morris, J. Garrett ; Wadler, Philip. / λdB: Blame tracking at higher fidelity. Paper presented at First ACM SIGPLAN Workshop on Gradual Typing, New Orleans, United States.22 p.