Edinburgh Research Explorer

Heavy ion radiation damage in double-sided silicon strip detectors

Research output: Contribution to journalArticle

Related Edinburgh Organisations

Original languageEnglish
Pages (from-to)445-451
Number of pages7
JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Issue number2-3
Publication statusPublished - 21 Feb 1996


A Cf fission fragment source was used to produce heavy-ion radiation damage in a double-sided silicon strip detector. It was found that a good quality fission fragment spectrum (as determined by the peak to valley ration N /N ) could not be achieved for radiation incident on the p face of the detector. However, for radiation incident on the n face, the ratio N /N remained adequate up to an accumulated dose of ∼4 × 10 fragments mm . For the measurement of alphas, typical resolution deteriorated from an initial 30 keV FWHM to 50 keV FWHM at a dose of ∼8 × 10 fragments mm for radiation incident on the n face, and ∼6 × 10 for radiation incident on the p face. The interstrip resistance in one region of the n face broke down completely after a relatively small radiation doses incident on that face. Further investigation of this is still required.

ID: 14709269