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Heavy ion radiation damage in double-sided silicon strip detectors

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Original languageEnglish
Pages (from-to)445-451
Number of pages7
JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume370
Issue number2-3
DOIs
Publication statusPublished - 21 Feb 1996

Abstract

A Cf fission fragment source was used to produce heavy-ion radiation damage in a double-sided silicon strip detector. It was found that a good quality fission fragment spectrum (as determined by the peak to valley ration N /N ) could not be achieved for radiation incident on the p face of the detector. However, for radiation incident on the n face, the ratio N /N remained adequate up to an accumulated dose of ∼4 × 10 fragments mm . For the measurement of alphas, typical resolution deteriorated from an initial 30 keV FWHM to 50 keV FWHM at a dose of ∼8 × 10 fragments mm for radiation incident on the n face, and ∼6 × 10 for radiation incident on the p face. The interstrip resistance in one region of the n face broke down completely after a relatively small radiation doses incident on that face. Further investigation of this is still required.

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