Edinburgh Research Explorer

iDRM: Humanoid motion planning with realtime end-pose selection in complex environments

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Standard

iDRM: Humanoid motion planning with realtime end-pose selection in complex environments. / Yang, Yiming; Ivan, Vladimir; Li, Zhibin; Fallon, Maurice; Vijayakumar, Sethu.

Humanoid Robots (Humanoids), 2016 IEEE-RAS 16th International Conference on. Institute of Electrical and Electronics Engineers (IEEE), 2017. p. 271-278.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harvard

Yang, Y, Ivan, V, Li, Z, Fallon, M & Vijayakumar, S 2017, iDRM: Humanoid motion planning with realtime end-pose selection in complex environments. in Humanoid Robots (Humanoids), 2016 IEEE-RAS 16th International Conference on. Institute of Electrical and Electronics Engineers (IEEE), pp. 271-278, 2016 IEEE-RAS 16th International Conference on Humanoid Robots, Cancun, Mexico, 15/11/16. https://doi.org/10.1109/HUMANOIDS.2016.7803288

APA

Yang, Y., Ivan, V., Li, Z., Fallon, M., & Vijayakumar, S. (2017). iDRM: Humanoid motion planning with realtime end-pose selection in complex environments. In Humanoid Robots (Humanoids), 2016 IEEE-RAS 16th International Conference on (pp. 271-278). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/HUMANOIDS.2016.7803288

Vancouver

Yang Y, Ivan V, Li Z, Fallon M, Vijayakumar S. iDRM: Humanoid motion planning with realtime end-pose selection in complex environments. In Humanoid Robots (Humanoids), 2016 IEEE-RAS 16th International Conference on. Institute of Electrical and Electronics Engineers (IEEE). 2017. p. 271-278 https://doi.org/10.1109/HUMANOIDS.2016.7803288

Author

Yang, Yiming ; Ivan, Vladimir ; Li, Zhibin ; Fallon, Maurice ; Vijayakumar, Sethu. / iDRM: Humanoid motion planning with realtime end-pose selection in complex environments. Humanoid Robots (Humanoids), 2016 IEEE-RAS 16th International Conference on. Institute of Electrical and Electronics Engineers (IEEE), 2017. pp. 271-278