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Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples

Research output: Contribution to journalArticlepeer-review

  • Ondrej Mandula
  • Martin Kielhorn
  • Kai Wicker
  • Gerhard Krampert
  • Ingo Kleppe
  • Rainer Heintzmann

Related Edinburgh Organisations

Original languageEnglish
Pages (from-to)24167
JournalOptics Express
Issue number22
Publication statusPublished - 22 Oct 2012


Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen’s inner structure.

ID: 18458202