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Random telegraph noise in metallic single-walled carbon nanotubes

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  • Hyun-Jong Chung
  • Tae-Woo Uhm
  • Sung-Won Kim
  • Young-Gyu You
  • Sang Wook Lee
  • Sung-Ho Jhang
  • Eleanor E.B. Campbell
  • Yung Woo Park

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http://scitation.aip.org/content/aip/journal/apl/104/19/10.1063/1.4876443
Original languageEnglish
Article number193102
Number of pages4
JournalApplied Physics Letters
Volume104
Issue number19
Early online date13 May 2014
DOIs
Publication statusPublished - 13 May 2014

Abstract

We have investigated random telegraph noise (RTN) observed in individual metallic carbon nanotubes (CNTs). Mean lifetimes in high- and low-current states, τhigh and τlow, have been studied as a function of bias-voltage and gate-voltage as well as temperature. By analyzing the statistics and features of the RTN, we suggest that this noise is due to the random transition of defects between two metastable states, activated by inelastic scattering with conduction electrons. Our results indicate an important role of defect motions in the 1/f noise in CNTs.

    Research areas

  • carbon nanotubes, random telegraph noise, activation energies, electric measurements, electrodes

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